/ Home
/ SUBMISSION

/ The BJNANO
/ Diamond Open Access
/ Journal Statistics
/ Editorial Board
/ Community
/ Call for papers

/ Latest Articles
/ Most accessed
/ Thematic issues
/ Volumes
/ Authors

/ Alerts

/ TWITTER
/ LINKEDIN
/ Mastodon
/ RSS FEED

Empty search

Article Type

Publication Date Range

Search Tips

This search combines search strings from the content search (i.e. "Full Text", "Author", "Title", "Abstract", or "Keywords") with "Article Type" and "Publication Date Range" using the AND operator.

Search Examples

aromatic	the word “aromatic”
aromatic aldehyde	the word “aromatic” OR “aldehyde”
+aromatic +aldehyde	both words “aromatic” AND “aldehyde”
+aromatic -aldehyde	the word “aromatic” but NOT “aldehyde”
“aromatic aldehyde”	the exact phrase “aromatic aldehyde”
benz*	words which begin with “benz”, such as “benzene” or “benzyl”
benz*yl	words that begin with “benz” and end with “yl”, such as “benzyl” or “benzoyl”
benzyl~	words that are close to the word “benzyl”, such as “benzoyl” (i.e., fuzzy search)

BROWSE
Latest Articles
Most accessed
thematic issues
volumes
authors

BROWSE

Latest Articles Most Accessed Thematic Issues Volumes Authors

Author

2 article(s) from Pürckhauer, Korbinian

Determining amplitude and tilt of a lateral force microscopy sensor

Oliver Gretz,
Alfred J. Weymouth,
Thomas Holzmann,
Korbinian Pürckhauer and
Franz J. Giessibl

Beilstein J. Nanotechnol. 2021, 12, 517–524, doi:10.3762/bjnano.12.42

PDF

Figure 1: (a) Sketch of the qPlus sensor in LFM orientation with amplitude A and the sensor tilt θ. (b) Photo...

Jump to Figure 1

Figure 2: Simulated Morse potential interaction for a LFM setup and comparison to normal AFM. θ is defined by ...

Jump to Figure 2

Figure 3: Simulating the effect of a laterally oscillating tip with different amplitudes and tilt angles on t...

Jump to Figure 3

Figure 4: Two-dimensional (2D) current map without oscillation and calculated and recorded curve with oscilla...

Jump to Figure 4

Figure 5: Structure of the fitting algorithm to avoid a local minimum. Random starting values within definabl...

Jump to Figure 5

Figure 6: Error as a function of A and θ. (a) The blue circles show the calculated error for varying amplitud...

Jump to Figure 6

Figure 7: Two-dimensional (2D) current map without oscillation and calculated and recorded curve with oscilla...

Jump to Figure 7

Album

Supp Info

Full Research Paper

Published 01 Jun 2021

Full text

Ion mobility and material transport on KBr in air as a function of the relative humidity

Dominik J. Kirpal,
Korbinian Pürckhauer,
Alfred J. Weymouth and
Franz J. Giessibl

Beilstein J. Nanotechnol. 2019, 10, 2084–2093, doi:10.3762/bjnano.10.203

PDF

Figure 1: 1D schematic of the tip–sample convolution at islands and holes. Due to the tip geometry step edges...

Jump to Figure 1

Figure 2: 1.5 μm × 1.0μm sections showing the time evolution of artificial defects and accumulations in three...

Jump to Figure 2

Figure 3: Maximum depth of the observed holes over time. The poking holes to which the letters correspond is ...

Jump to Figure 3

Figure 4: 200 nm × 200 nm 3D profile image of the generated scratching site directly taken after generating, ...

Jump to Figure 4

Figure 5: Volume of the hole and accumulation at 3.0% < RH < 5.5% within seven days. No significant change in...

Jump to Figure 5

Figure 6: 250 nm × 250 nm images of the time evolution of both defect and accumulation at different consecuti...

Jump to Figure 6

Figure 7: Time evolution of both defect and accumulation volume. After an initial settling time the logarithm...

Jump to Figure 7

Figure 8: 200 nm × 200 nm sections of the time evolution of the scratching site at RH = 28.2%. Each image is ...

Jump to Figure 8

Figure 9: Time course of the size and change rate of the observed defect (upper position) and accumulation (l...

Jump to Figure 9

Album

Supp Info

Full Research Paper

Published 30 Oct 2019

Full text

Other Beilstein-Institut Open Science Activities

/ Help / Support & Contact / Alerts / Privacy Policy / Terms & Conditions / Impressum